The JEOL JEM-F200 is our current cryo-TEM and is used for screening of cryo-samples as well as room temperature applications such as tomography.
- Equipped with a Schottky FEG and Direct Electron DE16 camera
- STEM capable and features an oxford instruments EDS detector for composition analysis
- Accelerating voltage of 80 to 200 kV
- Resolution up to 0.16 nm
- Magnification of 10 to 12000000x
