SEMs produce images by directing a high-energy beam of electrons onto a sample and scanning it in a zig-zag pattern (raster scanning). Most modern scanning electron microscopes will likely use several types of detectors to collect all different signals generated by the electrons and the sample. This allows the user to optimally detect, capture, collect and display other analytical and imaging modes as desired enabling mapping of different elemental species within the sample’s area of interest. Depending on how deep within the sample the electrons are generated, information about the sample elemental composition can also be gathered.

As with TEM samples, SEM samples need to withstand vacuum. Therefore, they also require specific preparation methods.

Some of our publications featuring SEM applications:

Comparative analysis of dental erosion on natural buccal and occlusal enamel surfaces.

Exploring the Multifunctional Potential of Bioactive Glass-Ionomer Cements

Biomimetic Mineralization of Keratin Scaffolds for Enamel Regeneration

Equipment available

• JEOL NeoScope JCM 7000
• JEOL JSM 7800F Prime