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Take Your Investigation to the Next Level.

The EVO LS15 SEM takes over when you’ve reached the resolution orcontrast limit of light microscopy, but still need answers.

High Resolution Surface Morphology

Secondary electron (SE) imaging –with a maximum resolution of a coupleof nanometers – comfortably coversmost of the sub-micron length-scale.While light microscopy yields contrast(reflections) from surfaces, secondaryelectron emission yields contrast fromedges on the sample surface, therebyproviding greater detail of surfacemorphology, such as that of metalfractures.

Compositional Imaging

Backscattered electron (BSE) imagingyields contrast that is directlyproportional to the density of thematerials that constitute your parts orassemblies. It provides a snapshot ofcompositional heterogeneity that canhelp you determine the root cause ofmaterial failure or quality excursions.


If SEM imaging alone isn’t enough to gain a complete understanding of parts or samples, investigators will turn to Energy Dispersive Spectroscopy (EDS) to acquire spatially resolved elemental information from these surfaces.

ZEISS SmartEDX is the dedicated microanalysis solution designed specifically for analytical routine applications performed on the ZEISS EVO to improve both ease of use and workflow repeatability in multi-user environments. 

Zeiss EVO LS15 Scanning Electron Microscope with EDX

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