Shannon is an Electron Microscopy Specialist with a decade of experience in advanced and analytical microscopy. He supports diverse research projects across life and physical sciences with expertise encompassing advanced Scanning Electron Microscopy (SEM), with a focus on high-resolution imaging, Energy Dispersive X-ray Spectroscopy (EDS), and Array Tomography. His skillset also includes comprehensive Transmission Electron Microscopy (TEM) support, specialising in Scanning TEM (STEM), analytical STEM-EDS, and electron diffraction for structural characterisation. Shannon is an integral part of facility operations, serving as the facility Safety Officer and heading the facility sustainability initiatives through LEAF accreditation.