The JEOL JEM-F200 is our 200Kv Transmission Electron Microscope for advanced room temperature applications such as electron tomography.
- Equipped with a Schottky FEG and a JEOL SightSKY camera
- STEM capable and features an oxford instruments EDS detector for composition analysis
- Accelerating voltage of 80 to 200 kV
- Resolution up to 0.16 nm
- Magnification of 10 to 12000000x
